RAMON.space unique technology for Rad-Hard By Design (RHBD) electronic components. RadSafe™ technology and IP cores are tested for radiation immunity, passing in excess of 300 Krad(Si) TID and 100 MeV*cm /mg SEL and SEU tests. RadSafe™ products are suitable for LEO, GEO and outer space applications.
Radiation test chips fabricated using RadSafe18™
JPIC and GR712RC fabricated using RadSafe18™
RadSafe implementation on TSMC 65nm CMOS technology. Ramon Chips RC64 is based on RadSafe65™.
Radiation test chip fabricated using RadSafe65™
RC64 fabricated using RadSafe65™